Review




Structured Review

Koehler Instrument focused helium-ion beam
Focused Helium Ion Beam, supplied by Koehler Instrument, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+helium-ion+beam/focused+helium+ion+beam/pm40296726-257-37-19
Average 90 stars, based on 1 article reviews
focused helium-ion beam - by Bioz Stars, 2026-09
90/100 stars

Images

Related Articles

other:

Article Title: Quantification of defects engineered in single layer MoS2
Article Snippet: 26 M. G. Stanford, P. R. Pudasaini, A. Belianinov, N. Cross, J. H. Noh, M. R. Koehler and P. D. Rack, Focused heliumion beam irradiation effects on electrical transport properties of ew-layer WSe2: enabling nanoscale direct write homo-junctions, Sci.

Article Title: Development of Nickel-Based Negative Tone Metal Oxide Cluster Resists for Sub-10 nm Electron Beam and Helium Ion Beam Lithography.
Article Snippet: Hybrid metal-organic cluster resist materials, also termed organo-inorganics, demonstrate their potential for use in next-generation lithography owing to their ability for patterning down to ~10 nm or beyond.. High-resolution resist patterning is integrally associated with the compatibility of the resist and irradiation of the exposure source.. Helium ion beam lithography (HIBL) is an emerging approach for the realization of sub-10 nm patterns at considerably lower line-edge/width roughness (LER/LWR) and higher sensitivity as compared to electron beam lithography (EBL).

Article Title: Thickness-Independent Semiconducting-to-Metallic Conversion in Wafer-Scale Two-Dimensional PtSe 2 Layers by Plasma-Driven Chalcogen Defect Engineering.
Article Snippet: is published by the American Chemical Society.. 1155 Sixteenth Street N.W., Washington, DC 20036 Published by American Chemical Society.. Copyright © American Chemical Society.

Article Title: Optoelectronics of Multijunction Heterostructures of Transition Metal Dichalcogenides.
Article Snippet: Among p−n junction devices with multilayered heterostructures with WSe2 and MoSe2, a device with the MoSe2− WSe2−MoSe2 (NPN) structure showed a remarkably high photoresponse, which was 1000 times higher than the MoSe2− WSe2 (NP) structure.. The ideality factor of the NPN structure was estimated to be ∼1, lower than that of the NP structure.. It is claimed that the NPN structure formed a thinner depletion region than that of the NP structure because of the difference of carrier concentrations of MoSe2 and WSe2.

Article Title: Dose-dependent effect of proton irradiation on electrical properties of WSe 2 ambipolar field effect transistors.
Article Snippet: Please note that technical editing may introduce minor changes to the text and/or graphics, which may alter content.. The journal’s standard Terms & Conditions and the Ethical guidelines still apply.. In no event shall the Royal Society of Chemistry be held responsible for any errors or omissions in this Accepted Manuscript or any consequences arising from the use of any information it contains.

Article Title: Defect Density and Atomic Defect Recognition in the Middle Layer of a Trilayer MoS 2 Stack.
Article Snippet: Small 2019, 15 (24), 1901423. (8) Stanford, M. G.; Pudasaini, P. R.; Belianinov, A.; Cross, N.; Noh, J. H.; Koehler, M. R.; Mandrus, D. G.; Duscher, G.; Rondinone, A. J.; Ivanov, I. N.; Ward, T. Z.; Rack, P. D. Focused helium-ion beam irradiation effects on electrical transport properties of few-layer WSe2: enabling nanoscale direct write homo-junctions.

Article Title: NaCl-Assisted One-Step CVD for In-Plane 1T/1H Heterophase Homojunctions in Monolayer WS 2 .
Article Snippet: Two-dimensional WS2 offers promising advantages for various applications due to its semiconducting 1H phase and metallic 1T phase.. However, the instability of the 1T phase and the difficulty of achieving a stable phase coexistence present significant challenges.. Here, we adopt the NaCl-assisted one-step chemical vapor deposition method that enables the spatial coexistence and precise control of 1H and 1T phases within monolayer WS2.

Article Title: Extraordinary Radiation Hardness of Atomically Thin MoS 2 .
Article Snippet: We demonstrate that atomically thin layered two-dimensional (2D) semiconductors are promising candidates for space electronics owing to their inherent and extraordinary resilience to radiation damage from energetic heavy charged particles.. In particular, we found that ultrathin MoS2 nanosheets can easily withstand proton and helium irradiation with fluences as high as ~1016 ions/cm2 and ~1015 ions/cm2, respectively, corresponding to hundreds or thousands of years of unshielded exposure to radiation in space.. While radiation effects on 2D material-based field effect transistors (FETs) have been reported in the recent past, none of these studies could isolate the impact of irradiation on standalone ultrathin 2D layers.



Similar Products

90
Carl Zeiss focused helium ion beam orion helium ion microscope
Focused Helium Ion Beam Orion Helium Ion Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+helium-ion+beam/beam+focused+ion/pm40445569-473-11-19
Average 90 stars, based on 1 article reviews
focused helium ion beam orion helium ion microscope - by Bioz Stars, 2026-09
90/100 stars
  Buy from Supplier

90
Koehler Instrument focused helium-ion beam
Focused Helium Ion Beam, supplied by Koehler Instrument, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+helium-ion+beam/focused+helium+ion+beam/pm40296726-257-37-19
Average 90 stars, based on 1 article reviews
focused helium-ion beam - by Bioz Stars, 2026-09
90/100 stars
  Buy from Supplier

90
Carl Zeiss focused helium ion beam milling
Focused Helium Ion Beam Milling, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+helium-ion+beam/beam+focused+ion/pmc11910605-213-8-12
Average 90 stars, based on 1 article reviews
focused helium ion beam milling - by Bioz Stars, 2026-09
90/100 stars
  Buy from Supplier

90
Carl Zeiss helium focused ion beam
a Phase diagram of three working modes under different <t>HFIB</t> dose density, manipulated by the dwell time and the scan spot density. The background color map shows the dose density ranges from 10 −2 −10 4 ions/nm 2 . The horizontal axis corresponds to the reciprocal of the square of the scan spot spacing, s −2 , which represents the number of scan spots within 1 nm 2 . The imaging mode exerts no influence to samples (blue squares); the inducing mode can induce directional liquid flow (red circles); and the damaging mode can etch samples and induce Helium bubbling (cyan triangle). b The hierarchical branched flow pattern of ionic liquid after a frame of HFIB scan. The IL will eventually fill the entire irradiated area in 30 s. c Contact line region of the IL reservoir and nano-patterning-and-visualization-engine pattern design. Left is a schematic diagram, and right is <t>an</t> <t>HIM</t> image. The white arrow indicates the pattern direction and area in NPVE. The dashed yellow box represents the CTL region chosen for HFIB scan. d The rectangular film pattern (50 μm × 1 μm) fabricated by IBFW. The insets are the details to manifest small corner radius and well reproduction of the design, the yellow box edges are 2 μm. e The IBFW fabricated ‘PKU COE’ pattern demonstrates its potential in on-demand printing of complex liquid film networks. f The minimal line width that IBFW can fabricate is around 106 nm.
Helium Focused Ion Beam, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+helium-ion+beam/beam+focused+ion/pmc10997651-26-1-17
Average 90 stars, based on 1 article reviews
helium focused ion beam - by Bioz Stars, 2026-09
90/100 stars
  Buy from Supplier

90
Carl Zeiss helium-ion focused ion beam microscopy carl zeiss orion nanofab
a Phase diagram of three working modes under different <t>HFIB</t> dose density, manipulated by the dwell time and the scan spot density. The background color map shows the dose density ranges from 10 −2 −10 4 ions/nm 2 . The horizontal axis corresponds to the reciprocal of the square of the scan spot spacing, s −2 , which represents the number of scan spots within 1 nm 2 . The imaging mode exerts no influence to samples (blue squares); the inducing mode can induce directional liquid flow (red circles); and the damaging mode can etch samples and induce Helium bubbling (cyan triangle). b The hierarchical branched flow pattern of ionic liquid after a frame of HFIB scan. The IL will eventually fill the entire irradiated area in 30 s. c Contact line region of the IL reservoir and nano-patterning-and-visualization-engine pattern design. Left is a schematic diagram, and right is <t>an</t> <t>HIM</t> image. The white arrow indicates the pattern direction and area in NPVE. The dashed yellow box represents the CTL region chosen for HFIB scan. d The rectangular film pattern (50 μm × 1 μm) fabricated by IBFW. The insets are the details to manifest small corner radius and well reproduction of the design, the yellow box edges are 2 μm. e The IBFW fabricated ‘PKU COE’ pattern demonstrates its potential in on-demand printing of complex liquid film networks. f The minimal line width that IBFW can fabricate is around 106 nm.
Helium Ion Focused Ion Beam Microscopy Carl Zeiss Orion Nanofab, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+helium-ion+beam/beam+focused+ion/10__1007_slash_s42765___022___00171___6-72-0-5
Average 90 stars, based on 1 article reviews
helium-ion focused ion beam microscopy carl zeiss orion nanofab - by Bioz Stars, 2026-09
90/100 stars
  Buy from Supplier

90
Carl Zeiss focusing ion beam helium ion microscope
a Phase diagram of three working modes under different <t>HFIB</t> dose density, manipulated by the dwell time and the scan spot density. The background color map shows the dose density ranges from 10 −2 −10 4 ions/nm 2 . The horizontal axis corresponds to the reciprocal of the square of the scan spot spacing, s −2 , which represents the number of scan spots within 1 nm 2 . The imaging mode exerts no influence to samples (blue squares); the inducing mode can induce directional liquid flow (red circles); and the damaging mode can etch samples and induce Helium bubbling (cyan triangle). b The hierarchical branched flow pattern of ionic liquid after a frame of HFIB scan. The IL will eventually fill the entire irradiated area in 30 s. c Contact line region of the IL reservoir and nano-patterning-and-visualization-engine pattern design. Left is a schematic diagram, and right is <t>an</t> <t>HIM</t> image. The white arrow indicates the pattern direction and area in NPVE. The dashed yellow box represents the CTL region chosen for HFIB scan. d The rectangular film pattern (50 μm × 1 μm) fabricated by IBFW. The insets are the details to manifest small corner radius and well reproduction of the design, the yellow box edges are 2 μm. e The IBFW fabricated ‘PKU COE’ pattern demonstrates its potential in on-demand printing of complex liquid film networks. f The minimal line width that IBFW can fabricate is around 106 nm.
Focusing Ion Beam Helium Ion Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+helium-ion+beam/beam+focused+ion/10__1002_slash_gj__4387-48-129-142
Average 90 stars, based on 1 article reviews
focusing ion beam helium ion microscope - by Bioz Stars, 2026-09
90/100 stars
  Buy from Supplier

90
Carl Zeiss helium focused ion beam (he-fib) system zeiss orion nanofab
a Phase diagram of three working modes under different <t>HFIB</t> dose density, manipulated by the dwell time and the scan spot density. The background color map shows the dose density ranges from 10 −2 −10 4 ions/nm 2 . The horizontal axis corresponds to the reciprocal of the square of the scan spot spacing, s −2 , which represents the number of scan spots within 1 nm 2 . The imaging mode exerts no influence to samples (blue squares); the inducing mode can induce directional liquid flow (red circles); and the damaging mode can etch samples and induce Helium bubbling (cyan triangle). b The hierarchical branched flow pattern of ionic liquid after a frame of HFIB scan. The IL will eventually fill the entire irradiated area in 30 s. c Contact line region of the IL reservoir and nano-patterning-and-visualization-engine pattern design. Left is a schematic diagram, and right is <t>an</t> <t>HIM</t> image. The white arrow indicates the pattern direction and area in NPVE. The dashed yellow box represents the CTL region chosen for HFIB scan. d The rectangular film pattern (50 μm × 1 μm) fabricated by IBFW. The insets are the details to manifest small corner radius and well reproduction of the design, the yellow box edges are 2 μm. e The IBFW fabricated ‘PKU COE’ pattern demonstrates its potential in on-demand printing of complex liquid film networks. f The minimal line width that IBFW can fabricate is around 106 nm.
Helium Focused Ion Beam (He Fib) System Zeiss Orion Nanofab, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+helium-ion+beam/beam+focused+ion/10__1063_slash_5__0038448-103-4-10
Average 90 stars, based on 1 article reviews
helium focused ion beam (he-fib) system zeiss orion nanofab - by Bioz Stars, 2026-09
90/100 stars
  Buy from Supplier

90
Koehler Instrument focused helium-ion beam irradiation
a Phase diagram of three working modes under different <t>HFIB</t> dose density, manipulated by the dwell time and the scan spot density. The background color map shows the dose density ranges from 10 −2 −10 4 ions/nm 2 . The horizontal axis corresponds to the reciprocal of the square of the scan spot spacing, s −2 , which represents the number of scan spots within 1 nm 2 . The imaging mode exerts no influence to samples (blue squares); the inducing mode can induce directional liquid flow (red circles); and the damaging mode can etch samples and induce Helium bubbling (cyan triangle). b The hierarchical branched flow pattern of ionic liquid after a frame of HFIB scan. The IL will eventually fill the entire irradiated area in 30 s. c Contact line region of the IL reservoir and nano-patterning-and-visualization-engine pattern design. Left is a schematic diagram, and right is <t>an</t> <t>HIM</t> image. The white arrow indicates the pattern direction and area in NPVE. The dashed yellow box represents the CTL region chosen for HFIB scan. d The rectangular film pattern (50 μm × 1 μm) fabricated by IBFW. The insets are the details to manifest small corner radius and well reproduction of the design, the yellow box edges are 2 μm. e The IBFW fabricated ‘PKU COE’ pattern demonstrates its potential in on-demand printing of complex liquid film networks. f The minimal line width that IBFW can fabricate is around 106 nm.
Focused Helium Ion Beam Irradiation, supplied by Koehler Instrument, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+helium-ion+beam/focused+helium+ion+beam/10__1021_slash_acsaelm__0c00788-337-35-17
Average 90 stars, based on 1 article reviews
focused helium-ion beam irradiation - by Bioz Stars, 2026-09
90/100 stars
  Buy from Supplier

Image Search Results


a Phase diagram of three working modes under different HFIB dose density, manipulated by the dwell time and the scan spot density. The background color map shows the dose density ranges from 10 −2 −10 4 ions/nm 2 . The horizontal axis corresponds to the reciprocal of the square of the scan spot spacing, s −2 , which represents the number of scan spots within 1 nm 2 . The imaging mode exerts no influence to samples (blue squares); the inducing mode can induce directional liquid flow (red circles); and the damaging mode can etch samples and induce Helium bubbling (cyan triangle). b The hierarchical branched flow pattern of ionic liquid after a frame of HFIB scan. The IL will eventually fill the entire irradiated area in 30 s. c Contact line region of the IL reservoir and nano-patterning-and-visualization-engine pattern design. Left is a schematic diagram, and right is an HIM image. The white arrow indicates the pattern direction and area in NPVE. The dashed yellow box represents the CTL region chosen for HFIB scan. d The rectangular film pattern (50 μm × 1 μm) fabricated by IBFW. The insets are the details to manifest small corner radius and well reproduction of the design, the yellow box edges are 2 μm. e The IBFW fabricated ‘PKU COE’ pattern demonstrates its potential in on-demand printing of complex liquid film networks. f The minimal line width that IBFW can fabricate is around 106 nm.

Journal: Nature Communications

Article Title: Rewritable printing of ionic liquid nanofilm utilizing focused ion beam induced film wetting

doi: 10.1038/s41467-024-47018-9

Figure Lengend Snippet: a Phase diagram of three working modes under different HFIB dose density, manipulated by the dwell time and the scan spot density. The background color map shows the dose density ranges from 10 −2 −10 4 ions/nm 2 . The horizontal axis corresponds to the reciprocal of the square of the scan spot spacing, s −2 , which represents the number of scan spots within 1 nm 2 . The imaging mode exerts no influence to samples (blue squares); the inducing mode can induce directional liquid flow (red circles); and the damaging mode can etch samples and induce Helium bubbling (cyan triangle). b The hierarchical branched flow pattern of ionic liquid after a frame of HFIB scan. The IL will eventually fill the entire irradiated area in 30 s. c Contact line region of the IL reservoir and nano-patterning-and-visualization-engine pattern design. Left is a schematic diagram, and right is an HIM image. The white arrow indicates the pattern direction and area in NPVE. The dashed yellow box represents the CTL region chosen for HFIB scan. d The rectangular film pattern (50 μm × 1 μm) fabricated by IBFW. The insets are the details to manifest small corner radius and well reproduction of the design, the yellow box edges are 2 μm. e The IBFW fabricated ‘PKU COE’ pattern demonstrates its potential in on-demand printing of complex liquid film networks. f The minimal line width that IBFW can fabricate is around 106 nm.

Article Snippet: The Helium focused ion beam (HFIB) is generated by a state-of-the-art Helium ion microscope (HIM, ORION NanoFab, Zeiss), which can provide a beam spot of diameter 0.5 nm, and a wide range of dose densities.

Techniques: Imaging, Irradiation